Upright Material Science Microscopes UM 210
> Reflected light microscopy is the choice for imaging opaque samples. The sample is illuminated from above through the objective. Because light is unable to pass through opaque samples, it is directed on the surface and returned to the objective by reflection
> Upright reflected light microscope has two eyepieces, normally 10x magnification, and, in most cases, a tube head dedicated for using a camera system, this connection is normally on the viewing tube.
> The nosepiece is capable of holding from four to six objectives, these can be recognized by the Epi tag on their external cover.
> Mechanical stage sample holder can be moved in the XY axis , while the entire stage can be moved up and down through coarse and fine focusing mechanism. In certain configurations these movements can be automated by using motorized stage systems.
> The illumination system is built-in with dedicate lamp housing, the generated light passes through a vertical illuminator between the nosepiece and below the viewing tube head.
> The sample is placed upside down on the stage with the surface to be observed facing the objective.
> Several techniques are commonly used: Brightfield, Darkfield, Polarized light and Differential Interference Contrast (DIC).
- Additional information
Microscopes is designed to supply state-of-the-art reliability and cost/efficient high performance
echoLAB offers also necessary accessories, high performance cameras and different software from basic image capture (included with the camera) to advanced automated image analysis for particle sizing and metallurgical analysis (e.g. grain size, inclusion counts, porosity etc).
Software is leading-edge digital imaging software for a wide variety of metallurgical applications, for labs set up, for quality control or quality assurance, production, inspection, failure analysis and research
|Total magnification||50x – 100x – 400x – 600x|
|Eyepiece||WF 10x (ø22mm)|
|Plan achromatic objectives long working distance||PL L 5x/0.12 WD=26.1mm|
|PL L 10x/0.25 WD=20,2mm|
|PL L 40x/0.60 WD=3.98mm|
|PL L 60x/0.75 WD=3.18mm|
|Inclination of 30°|
|Interpupillary distance 55mm-75mm|
|Diopter adjustable ±5|
|Nosepiece||Quadruple back ball bearing inner locating|
|Stage||Double layer mechanical with glass insert, overall size 210x140mm|
|Coaxial motion 75x50mm|
|Focusing System||Coaxial coarse/fine focus system, minimum division of fine focusing 2μm|
|Tensional adjustable with upper stop|
|Reflected illumination||6V 30W halogen lamp with brightness control|
|Transmitted illumination||Kohler illumination 6V 20W halogen lamp with brightness control|
|Analyzer||360° rotatable analyzer|
|Filter||Yellow for reflected light|
|Blue for reflected light|
|Green for reflected light|
|Frosted glass filter for reflected light|
|Contrast techniques||Brightfield: Yes|
|Darkfiled: Not available|
|DIC: Not available|
|POL Contrast: Yes|
|Power suply||230V ±10% – 50/60Hz -1Ph – 30W|
> Reflected light microscopy is the choice for imaging opaque samples. The sample is illuminated from above through the objective. Because light is unable to pass through opaque samples, it is directed on the surface and returned to the objective by reflection.
> Most common samples are : metals, plastic materials, wood, silicon, ceramics etc
|UM E-210-01 Eyepiece WF10x (ø18mm) crosshair 0.1mm/Div|
|UM O-210-21 Long working distance objective PL L 20x/0.40 WD=8.80mm|
|UM O-210-22 Long working distance objective PL L 50x/0.70 WD=3.68mm|
|UM O-210-23 Long working distance objective PL L 80x/0.80 (Spring) WD=1.25mm|
|UM O-210-24 Long working distance objective PL L 100x/0.85 WD=0.40mm|
|UM F-210-61 Green filter for transmitted light|
|UM F-210-62 Yellow filter for transmitted light|
|UM CA-210-91 Camera adapter 0.5x|
|UM CA-210-92 Camera adapter 1x|
|UM CA-210-93 Camera adapter 0.5x with dividing 0.1mm/Div|
User-friendly interface, complete camera parameter control,