Flexible Detection for Clear Images
+ Tailor Sigma to your needs using the latest detection technology and characterize all of your samples.
+ Characterize composition, crystallography and surface topography with the annular backscatter detector (aBSD). It delivers excellent low kV images under all vacuum conditions.
+ Benefit from improved sensitivity, increased signal-to-noise ratio, and more speed.
+ Enjoy a new generation of secondary electron (SE) detectors. Benefit from the C2D and VPSE detectors of Sigma in variable pressure mode: working at low vacuum, you can expect crisp images with up to 85% more contrast.

Automate and Speed up Your Workflow
+ A 4-step workflow lets you control all the functionality of your Sigma. Benefit from fast time-to-image and save time on training – especially in a multi-user environment.
+ First, navigate your sample and then set optimal imaging conditions.
+ Next, automatically acquire images across multiple samples utilizing regions of interest (ROIs). + Finally use the workflow’s last step for contextual visualization of your results.
+ Finally, SmartSEM Touch collects and presents your data as an interactive map so you can understand your sample completely.

Perform Advanced Analytical Microscopy
+ Combine scanning electron microscopy and elemental analytics: the best-in-class EDS geometry of Sigma increases your analytical productivity, especially on beam sensitive samples.
+ Get analytical data at half the probe current and twice the speed.
+ Achieve complete, shadow-free analytics in your FE-SEM. Profit from using a short analytical working distance of 8.5 mm and a take-off angle of 35°.